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Opto Edu A62.4503 Compound Scanning Optical Microscope Atomic Force For Laboratory

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Opto Edu A62.4503 Compound Scanning Optical Microscope Atomic Force For Laboratory

Name: Opto Edu A624503 Compound Scanning Optical Microscope Atomic Force For Laboratory
Brand: CNOEC, OPTO-EDU
Price: 1 USD

Brand Name : CNOEC, OPTO-EDU

Model Number : A62.4503

Certification : CE, Rohs

Place of Origin : China

MOQ : 1 pc

Price : FOB $1~1000, Depend on Order Quantity

Payment Terms : T/T,West Union,Paypal

Supply Ability : 5000 pcs/ Month

Delivery Time : 5~20 Days

Packaging Details : Carton Packing, For Export Transportation

Operation modes : Contact mode, Tapping mode,phase,friction, MFM,EFM

Sample size : radius≤90mm,H≤20mm

Max. scan range : X/Y: 50μm, Z: 5μm

Resolution : X/Y: 0.2 nm, Z: 0.05nm

Scan rate : 0.6Hz~4.34Hz

Scanning control : XY: 18-bit D/A, Z: 16-bit D/A

Data sampling : One 14-bit A/D and double 16-bit A/D multiple-channel simultaneously

Windows : USB2.0, Compatible with Windows 98/2000/XP/7/8

Name : Laboratory research New Atomic Force Scanning Electron Microscope

Features : All-in-one design, smart structure and shape.

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Basic Level, Separate Controller & Main Body Design, With Contact Mode, Tapping Mode
Contact Mode, Tapping Mode, Scan Range XY 50x50um, Z 5um, Scan Resolution XY 0.2nm, Z 0.05nm
Sample Size Dia.<90mm, H<20mm, Stage Moving 25x25mm, Optical Objective APO 10x Resolution 1um
Scan Speed 0.6~30Hz, Scan Angle 0-360°, Output USB3.0 For Win7/8/10/11
Optional Work Mode: Friction Mode, Phase Mode, Magnetic Mode, Electrostatic Mode

Opto Edu A62.4503 Compound Scanning Optical Microscope Atomic Force For Laboratory

◆ The laser detection head and the sample scanning stage are integrated, the structure is very stable, and the anti-interference is strong

◆ Precision probe positioning device, laser spot alignment adjustment is very easy

◆ The single-axis drive sample automatically approaches the probe vertically, so that the needle tip is perpendicular to the sample scan

◆ The intelligent needle feeding method of motor-controlled pressurized piezoelectric ceramic automatic detection protects the probe and the sample

◆ High-precision and wide-ranging piezoelectric ceramic scanners can be freely selected

◆ High-magnification objective lens automatic optical positioning, no need to focus, real-time observation and positioning of the probe sample scanning area

◆ Spring suspension shockproof method, simple and practical, good shockproof effect

◆ Metal shielded soundproof box, built-in high-precision temperature and humidity sensor, real-time monitoring of the working environment

◆ Integrated scanner nonlinear correction user editor, nanometer characterization and measurement accuracy better than 98%

Specification	A62.4500	A62.4501	A62.4503	A62.4505
Work Mode	Tapping Mode 【Optional】 Contact Mode Friction Mode Phase Mode Magnetic Mode Electrostatic Mode	Contact Mode Tapping Mode 【Optional】 Friction Mode Phase Mode Magnetic Mode Electrostatic Mode	Contact Mode Tapping Mode 【Optional】 Friction Mode Phase Mode Magnetic Mode Electrostatic Mode	Contact Mode Tapping Mode 【Optional】 Friction Mode Phase Mode Magnetic Mode Electrostatic Mode
Current Spectrum Curve	RMS-Z Curve 【Optional】 F-Z Force Curve	RMS-Z Curve F-Z Force Curve	RMS-Z Curve F-Z Force Curve	RMS-Z Curve F-Z Force Curve
XY Scan Range	20×20um	20×20um	50×50um	50×50um
XY Scan Resolution	0.2nm	0.2nm	0.2nm	0.2nm
Z Scan Range	2.5um	2.5um	5um	5um
Y Scan Resolution	0.05nm	0.05nm	0.05nm	0.05nm
Scan Speed	0.6Hz~30Hz	0.6Hz~30Hz	0.6Hz~30Hz	0.6Hz~30Hz
Scan Angle	0~360°	0~360°	0~360°	0~360°
Sample Size	Φ≤90mm H≤20mm	Φ≤90mm H≤20mm	Φ≤90mm H≤20mm	Φ≤90mm H≤20mm
XY Stage Moving	15×15mm	15×15mm	25×25um	25×25um
Shock-Absorbing Design	Spring Suspension	Spring Suspension Metal Shielding Box	Spring Suspension Metal Shielding Box	-
Optical Syestem	4x Objective Resolution 2.5um	4x Objective Resolution 2.5um	10x Objective Resolution 1um	Eyepiece 10x Infinity Plan LWD APO 5x10x20x50x 5.0M Digital Camera 10" LCD Monitor, With Measuring LED Kohler Illumination Coaxial Coarse & Fine Focusing
Output	USB2.0/3.0	USB2.0/3.0	USB2.0/3.0	USB2.0/3.0
Software	Win XP/7/8/10	Win XP/7/8/10	Win XP/7/8/10	Win XP/7/8/10

	Resolution	Working Condition	Working Temperation	Damge to Sample	Inspection Depth
SPM	Atom Level 0.1nm	Normal, Liquid, Vacuum	Room or Low Temperation	None	1~2 Atom Level
TEM	Point 0.3~0.5nm Lattice 0.1~0.2nm	High Vaccum	Room Temperation	Small	Usually <100nm
SEM	6-10nm	High Vaccum	Room Temperation	Small	10mm @10x 1um @10000x
FIM	Atom Level 0.1nm	Super High Vaccum	30~80K	Damge	Atom Thickness

Microscope	Optical Microscope	Electron Microscope	Scanning Probe Microscope
Max Resolution (um)	0.18	0.00011	0.00008
Remark	Oil immersion 1500x	Imaging diamond carbon atoms	Imaging high-order graphitic carbon atoms
Remark

Probe-Sample Interaction	Measure Signal	Information
Force	Electrostatic Force	Shape
Tunnel Current	Current	Shape, Conductivity
Magnetic Force	Phase	Magnetic Structure
Electrostatic Force	Phase	charge distribution

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Opto Edu A62.4503 Compound Scanning Optical Microscope Atomic Force For Laboratory Images

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Opto Edu A62.4503 Compound Scanning Optical Microscope Atomic Force For Laboratory

Opto Edu A62.4503 Compound Scanning Optical Microscope Atomic Force For Laboratory

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Opto Edu A62.4503 Compound Scanning Optical Microscope Atomic Force For Laboratory Images